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Home / Physics & Electronic Laboratory Apparatus

MS-114 PVG MOVER

  • Wooden inclined plane length x breadth x thickness 600x160x20 mm. with pulley 22 mm. diameter hinged to a wooden base 450x100x20 mm. Metal linear scale fixed to the edge of the plane. o A vertical linear and 0-45 angular scale screwed to the base, with clamp shaped for use as on index. Complete with a metal pan of diameter 75 mm., cord, hooks, two wooden block 200x75 and 100x75, steel block 100x75mm. ACCESSORIES - For use with friction apparatus: A steel base plate size 610 x 90 x 6 mm. with four steel screws. Steel block with eye ring, one surface 100 x 75 mm. Steel block with eye ring 100 x 75 mm

Metal, size 75 x 50 mm., with four wheels, with lug and through
hole. Overall length approx 165 mm.

SKU: MS-114 MOVER Category: Physics & Electronic Laboratory Apparatus
  • Wooden inclined plane length x breadth x thickness 600x160x20 mm. with pulley 22 mm. diameter hinged to a wooden base 450x100x20 mm. Metal linear scale fixed to the edge of the plane. o A vertical linear and 0-45 angular scale screwed to the base, with clamp shaped for use as on index. Complete with a metal pan of diameter 75 mm., cord, hooks, two wooden block 200x75 and 100x75, steel block 100x75mm. ACCESSORIES - For use with friction apparatus: A steel base plate size 610 x 90 x 6 mm. with four steel screws. Steel block with eye ring, one surface 100 x 75 mm. Steel block with eye ring 100 x 75 mm
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  • Resistivity of Semiconductor by Four Probe Method at different temperatures and determination of the Band-gap .The Four Probe Method is one of the standard and most widely used methods for the measurement of resistivity of semiconductors. The four probes are collinear. The error due to contact resistance, which is especially serious in the electrical measurement on semiconductors, is avoided by the use of two extra contacts (probes) between the current contacts. In this arrangement the contact resistance may all be high compare to the sample resistance, but as long as the resistance of the sample and contact resistance are small compared with the effective resistance of the voltage measuring device (potentiometer, electrometer or electronic voltmeter), the measured value will remain unaffected. Because of pressure contacts, the arrangement is also especially useful for quick measurement on different samples or sampling different parts of the same sample MS-682 PVG FOUR PROBE METHOD APPARATUS
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